Instrumentation: Mass Analyzer Innovations

This Wednesday morning session will cover instrumental advances for improving signal-to-noise, digital waveform technology, ion mobility, and duty cycle, and for MS analysis of precursor and neutral loss scans and intact high m/z molecular ion analysis. It will be chaired by Randall E. Pedder of Ardara Technologies and will be held in Hall D from 8:30 to 10:30 a.m.

This session will open with a presentation by Andrew N. Krutchinsky of The Rockefeller University titled “A New Instrument for Improving the Signal-to-Noise of Mass Spectra.” Krutchinsky will discuss the development of a multi-quadrupole ion trap instrument that is capable of performing parallel MS operations and on-line charge separation and enrichment.

Krutchinsky’s presentation will be followed by a talk given by Peter T.A. Reilly of Washington State University titled “Advancing Digital Waveform Technology.” This presentation will describe how digital waveform technology can be used to develop new methods of operating traps and guides that vastly outperform current technology.

Chun-Yen Cheng of AcroMass Technologies in Taipei, Taiwan will then present a talk titled “inTrap-MALDI Charge Detection Mass Spectrometry for Intact High m/z Molecular Ion Analysis.” In this presentation, a system will be described that consists of three essential components: a charge-sensing particle detector, a high-accuracy quadrupole ion trap, and a waveform synthesizer that applies phase-modulated RF waveforms on the quadrupole ion trap.

Next, Xiaoyu Zhou of Tsinghua University, Beijing, China, will present “Ion Mobility Separation Using a Dual-Trap Instrument.” This talk will focus on a new technique that enables ion mobility separation achieved through multiple ion transfers between the traps.

The next presentation will be given by Dalton Snyder of Purdue University and is titled “Precursor and Neutral Loss Scans on Benchtop and Portable Ion Trap Mass Spectrometers.” Snyder’s presentation will document the first implementation of precursor and neutral loss scans on benchtop and portable linear ion trap systems.

The session’s final presentation, titled “Multiplexed Operation of an Orthogonal Multi-Reflecting TOF Instrument to Increase Duty Cycle by Two Orders,” will be given by Boris Kozlov of Waters Corporation. The talk will discuss a method that is artifact free and provides duty cycles comparable with conventional, non MR-TOF systems without affecting MR-TOF resolution and mass accuracy.